Week 13: Inductively Coupled Plasma (ICP)

Question 1

What is the fundamental principle behind ICP-based elemental analysis?

Question 2

Explain the role of argon gas in the ICP torch.

Question 3

How does the ICP torch generate high temperatures?

Question 4

Describe the process of atomization and ionization within the ICP.

Question 5

What are the key differences between ICP-AES and ICP-MS?

Question 6

Draw a schematic diagram of a typical ICP-OES instrument.

Question 7

What is the purpose of the nebulizer in an ICP system?

Question 8

Explain the function of the spray chamber.

Question 9

How does the monochromator in ICP-OES separate different wavelengths of light?

Question 10

Describe the role of the mass spectrometer in ICP-MS.

Question 11

What are the typical detection limits for ICP-AES and ICP-MS?

Question 12

Discuss the linear dynamic range of ICP techniques.

Question 13

How does matrix interference affect ICP measurements?

Question 14

Explain the concept of spectral interferences and how they are minimized.

Question 15

What are the advantages of ICP-MS over ICP-AES in terms of sensitivity and selectivity?

Question 16

List five common applications of ICP in environmental analysis.

Question 17

How is ICP used in the analysis of biological samples?

Question 18

Describe the use of ICP in geological and geochemical studies.

Question 19

Explain the role of ICP in the pharmaceutical industry.

Question 20

Discuss the application of ICP in forensic science.

Question 21

How are calibration standards prepared for ICP analysis?

Question 22

Explain the importance of internal standards in ICP measurements.

Question 23

Discuss the factors that influence the choice of analytical lines in ICP-OES.

Question 24

How can you optimize the operating conditions of an ICP torch for maximum sensitivity?

Question 25

Describe the process of method validation for ICP analysis.

Question 26

What are some common causes of signal drift in ICP measurements?

Question 27

How can you troubleshoot problems with nebulizer clogging?

Question 28

Describe the routine maintenance procedures for an ICP instrument.

Question 29

What are the safety considerations when working with an ICP system?

Question 30

Discuss the environmental impact of ICP analysis and waste disposal.

Question 31

What is Inductively Coupled Plasma (ICP)? A. A type of plasma source used for elemental analysis. B. A high-temperature gas that is used to excite atoms in a sample. C. A process that ionizes a sample and measures the emitted light. D. All of the above

Question 31

What is the most common gas used in ICP? A. Hydrogen B. Helium C. Argon D. Nitrogen

Question 32

What is the typical temperature of an ICP torch? A. 5000-6000 K B. 6000-7000 K C. 7000-8000 K D. 8000-9000 K

Question 33

What is the purpose of the nebulizer in an ICP system? A. To introduce the sample into the plasma. B. To cool the plasma. C. To remove impurities from the sample. D. To measure the emitted light.

Question 34

What is the difference between ICP-AES and ICP-MS? A. ICP-AES measures the intensity of emitted light, while ICP-MS measures the mass of ions. B. ICP-AES is more sensitive than ICP-MS. C. ICP-MS is more expensive than ICP-AES. D. All of the above

Question 35

What are some common applications of ICP? A. Environmental analysis B. Food analysis C. Pharmaceutical analysis D. Geological analysis E. All of the above

Question 36

What are some advantages of ICP over other analytical techniques? A. High sensitivity B. High precision C. Wide linear range D. Multi-elemental analysis E. All of the above

Question 37

What are some disadvantages of ICP? A. High cost B. Complex operation C. Potential for matrix interferences D. Requires specialized training E. All of the above

Question 38

What is the role of the RF generator in an ICP system? A. To produce the plasma. B. To introduce the sample into the plasma. C. To measure the emitted light. D. To cool the plasma.

Question 39

What is the purpose of the interface in an ICP-MS system? A. To separate ions based on their mass-to-charge ratio. B. To introduce the sample into the plasma. C. To remove neutral particles from the ion beam. D. To detect the ions.