Venter Flashcards
Incremental age-to-age factor
Venter
f(d) = incremental loss / prior cumulative loss
Tests of loss emergence (2)
Venter
- significance of factors
2. superiority to alternate emergence patterns
Test for significance of factors (and adjustment if measuring cumulative LDFs)
(Venter)
to be significant, a factor should be >= 2x it’s standard deviation
*if age-to-age factors are cumulative, test whether (1 - factor) is significant
Tests for superiority of alternate emergence patterns, implication of alternate emergence pattern, and definition of n and p (3)
(Venter)
- adjusted SSE
- AIC
- BIC
*implies that the linearity assumption fails
n = # predicted points (= # cells less 1st column) p = # parameters
Adjusted SSE formula
adjusted SSE = SSE / (n - p)^2
AIC formula
Venter
AIC = SSE * exp(2p / n)
BIC formula
Venter
BIC = SSE * n^(p / n)
Alternate emergence patterns (2)
- linear w/constant - expected incremental loss in next period given data to date = f(d) * cum loss to date + g(d)
» g(d) = avg incremental loss for age - factor * parameter - expected incremental loss in next period given data to date = f(d) * h*(w)
Loss emergence from linearity assumption
expected incremental loss in next period given data to date = f(d) * cum loss to date
Number of parameters in the CL, BF, and CC methods
Venter
CL = #AYs - 1 BF = 2 * (#AYs - 1) CC = same as CL
f(d) in CL vs. BF/CC methods
Venter
CL: f(d)’s are link ratios
BF/CC: f(d)’s are lag factors (incremental % reported)
Explain how the CC method is a reduced parameter version of the BF method
special case that uses h(w) = h (constant AY parameter across AYs)
Ways to reduce the number of parameters (4)
- assume the same AY level across several years
- assume subsequent development periods have the same % development
- fit a trend line through BF ultimate loss parameters
- group AYs with similar levels and fit an h parameters to each group
Residual tests (2) (Venter)
- linearity of development factors
2. stability of development factors
Tests of independence (2)
Venter
- correlation of development factors *»linearity test in Mack
- significantly high or low diagonals (CY effects)