Lecture 10: Fibres Part 2 Flashcards
Microscopic techniques for fibres
- Sterescopic
- Comparison
- Polarised
- Reflected light
- Fluorescence
- Thermal
- Darkfield
- Brightfield
- Multispectral
- Scanning and transmission electron microscope
- Crystallography and diffection
- Some methods are used more than others and some are destructve.
Micrscopic characteristics
Natural fibres
- Cotton is characterised by its twisted shape
- flax has characteristic nodes which is brought out in polarised light
- hemp has no nodes but has irregulations in terms of shape
- jute has some nodes, narrower, tapering at the ends (unique identifying feature), colourisation changes as it rotates
- silk has characteristic ribbon shape
- wool has scales which are characterizing
Microscopic characteristics
Synthetic fibres
- Synthetic fibres are uniform, more consistent but might have surface textures from the manufacturing process that allows us to identify them.
- Longitudinal Appearance - Texture; Crimping; Pigment. All can be unique to a manufacturing process or particular machine.
- Tri-lobal shape is the most common nlyon synthetic fibre as its designed to maximise its shape.
- Modification ratio is a good way of numerically desigining tri lobal fibres in order to identify and compare them
- Dye penetration and presence of crystalline regions (Crystalline structure will interact with the light more and has an identifiable region) or gas voids (defects along the surface) are key microscopic characteristics.
- It is easy to differentiate between natural and synthetic fibres based on their gross chraracteristics.
- Synthetic fibres are more regular.
- Cross sectional area can give you information about the fibre and its manufacturing process.
Modification ratio
MR = R / r
R = longer axis
How do we characterise nanostructures?
Done with a combination of techniques to study their chemical and physical properties… We care about 2 main types here:
1. Surface Microscopy - Scanning and transmission electron, atomic force
2. Bulk diffraction - x-ray powder, optical
Electron microscopy
Fibres
- The resolution of light microscopy is limited by the illuminating wavelength.
- Higher resolutions are achievable using electrons instead of light.
- Non-destructive analysis of very small quantities of material possible this way (although beam damage CAN occur for sensitive samples).
- Allows for the rapid accumulation of results in high resolution.
- Can even give elemental composition of a material.
- Can be non destructive depending on material and method, sometimes there is damage caused to sample.
- Quick technique to allow us to pick something out.
Properties of a light microscope
- 200nm resolutilon
- Low depth of focus
- Good field of view
- Easy and rapid sample preparation
- Relatively low cost (£35+)
SEM microscope properties
- 10 nm resolution
- High depth of focus
- Good field of view
- Easy and quite rapid specimen preparation
- High relative cost (£120K+)
- Takes longer for you to set up and prepare sample
- Valuable for trace analysis
TEM microscope properties
- 1 nm resolution
- Medium depth of focus
- Limited field of view
- Skilled and slow sample preparion required
- £300K+ cost
SEM for fibre analysis
- Can reveal surface features unseen in optical microscopy e.g. Scale-like features on the outer surface of Cashmilon bicomponent acrylic fibres.
- Or fibre-end fracture morphology of a polyester fibre in a woven fabric coat to complement optical damage analysis.
- Elemental analysis of fibres reveals more information.
Equal refractive indexes
In the event that the two refractive indices are equal, the light passing through the particle does not deviate at all, and the particle remains invisible.
Different refractive indexes
- When the refractive indices are far apart, the light passing through will change direction substantially.
- If refracted sufficiently, they miss the objective lens and these areas of the particle become dark, resulting in high contrast.
- RI is one of the most useful ways to identify a material
- Depending on the difference of RI of sampe and the mounting media, it will affect how the light transmit through into the cone and how it responds based on refraction, diffraction, snells law, etc.
- If theres high contrast that means there’s a high different in RI between media and sample so a lot of refraction of light (light gets pushed out away from the cone)
Measurement of refractive index - Becke line
- Take a particle and put it into focus on one plane and we move our focal point up and we see whether or not the light is focused inwards or outwards away from the sample in order to help identify it. Depending on whether the light has the halo effect or is pushed in, it allows us to determine if the RI difference between the sample amd mounting media is above or below it.
- Being able to qualitatively assess RI difference between the mounting medium and a particle is useful, but it’s also desirable to know whether the particle has a RI higher or lower than that of the mounting medium.
- This can be achieved using the Becke Line Test.
- Small particles behave much like lenses, refracting light in a manner that depends on the relative RI values of the particle and mounting medium
A particle with a higher refractive index
A particle with a higher RI mounted in a medium of lower RI, will focus axial illuminating rays toward a point above the particle.
A particle with a lower refractive index
Lower RI particle in higher RI medium will direct light in opposite direction. Moving the line outside the particle.