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Computer Aided Manufacturing > Coordinate Measuring Machines and Systems > Flashcards

Coordinate Measuring Machines and Systems Flashcards

1
Q

What is the primary function of a CMM

A

To measure the actual shape of a workpiece, compare it against the derired shape, and evaluate metrological information

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2
Q

Main components of a CMM

A
  • mechanical frame with three axes and displacement transducers
  • probe head
  • control unit
  • computer
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3
Q

Steps of a measurement with a CMM

A
  1. calibration of the stylus wrt the reference point of the head (center of the tip)
  2. determination of the Mathematical alignment: position and orientation of the workpiece reference frame wrt the machine reference frame
  3. measurement of the surface points on the workpiece
  4. evaluation of the geometric parameters of the workpiece
  5. representation or reporting of the results
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4
Q

Basic configurations of a CMM

A
  1. bridge (fixed or moving)
  2. cantilever
  3. horizontal arm
  4. gantry
  5. articulated arm
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5
Q

Moving bridge configuration: characteristics

A
  • stationary table and moving bridge
  • widely used
  • reduced bending of the horizontal axis
  • problem of yawing should be considered
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6
Q

Fixed bridge configuration: characteristics

A
  • moving table and fixed bridge
  • very rigid
  • reduced speed with heavy loads
  • no yawing problem
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7
Q

Cantilever configuration: characteristics

A
  • fixed table, cantilever arm
  • good accessibility
  • bending of the cantilever reduces the accuracy
  • suitable for long and thin parts
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8
Q

Horizontal arm configuration: characteristics

A
  • ideal for measurements on car bodies
  • moving long table
  • possible dual arm configuration to reduce time
  • excellent accessibility
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9
Q

Gantry configuration: characteristics

A
  • suitable for very large parts
  • fixed columns
  • easy accessibility
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10
Q

Articulated arm configuration: characteristics

A
  • robotic arm (non-cartesian CMM)
  • probe in the end effector
  • moved by an operator or by actuated joints
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11
Q

Hardware elements of a CMM

A
  1. structural elements
  2. bearing supports
  3. drive system
  4. displacement transducers
  5. probe head
  6. control system
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12
Q

ideal properties of the structural elements

A
  • dimensional stability
  • stiffness
  • low weight
  • high damping capacity
  • low coefficient of Thermal expansion
  • high thermal conductivity
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13
Q

Possible materials used

A
  • Granite: very often used
  • Aluminum: large thermal expansion compared to granite, but it has a very much higher thermal conductivity, so it is often used, since its deformation can be easily predicted and compensated
  • composite: good properties, easy to manufacture, can be designed to obtain the requested properties; expensive
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14
Q

Bearing systems

A
  1. noncontact air bearings
    - aerostatic air bearings use a thin film of air under pressure to provide load support
    - accurate
    - durable
  2. mechanical contact bearings
    - higher loads are supported
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15
Q

drive systems

A
  1. rack and pinion
    - simple
    - not very accurate for the backlash
  2. belt drive
    - simple
    - not very accurate for its elasticity
  3. friction drive
    - simple, cheap
    - low drive force
  4. ball screw
    - classical solution
    - high stiffness
  5. linear motor drive
    - very high stiffness
    - water cooling is required
    - expensive
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16
Q

displacement transudcers

A

they have the role of determining the probe position when it touches the surface

  1. transmission scale
    - made of glass
    - scale with 50-100 lines per mm
    - moving light source
    - scanning reticle
    - photocells measure fluctuation of the light, generating two sinusoidal signals phase-shifted by 90°
  2. reflection scale
    - made of steel
    - alternate reflecting lines and diffusing gaps
    - period signal produced by the photocell after reflection
  3. interferential scale
    - photoelectric head reads the interference fringes created by the light reflected from the scale
  4. laser interferometer scale
    - based on the light interference principle, discovered by Michelson and Morley
    - one laser ray is directed to a fixed mirror as a reference
    - one other laser ray is directed to a moving mirror
    - the interference figures revealed in the two mirrors are different, and can be used to determine the displacement of the moving mirror
    - much more accurate that optical systems, with resolution smaller that 1 nm
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17
Q

types of control strategies

A
  • . Point-to-Point control

- continuous-path control

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18
Q

point to point control

A
  • target position given as point coordinates
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19
Q

continuous path control

A
  1. precalculated scanning
    - probe moves to the target position along a defined path
    - used for known shape features
    - force is not controlled
    - force proportional to bending of the tip
  2. adaptive scanning control
    - adaptive control ensures that the tip Always maintains contact with the surface
    - useful for unknown features
    - actuators for each axis
    - modulated contact force
20
Q

fixturing

A
  • it should be accurate and keep the part in position
  • forces are very small so there are not many dynamics issues
  • aluminum is usually used
21
Q

types of probing systems

A
  • contact probes

- non-contact probes

22
Q

types of contact probes

A

in general, the information comes from the contact with the part

  • hard probe: the operator detects the contact
  • touch trigger probe: the machine detects the contact, then moves to another point
  • measuring probe: the machine measures the displacement of the tip; the movement is with constant contact with the surface, while the measurements are taken with a certain frequency
23
Q

types of touch-trigger probes

A
  • kinematic resistive probe
  • piezo-electric probe
  • fiber probe (optical)
24
Q

kinematic resistive probe: description

A

components:

  • probing element to establish a mechanical interaction with the workpiece
  • transmitting device (stylus stem)
  • force generating element (spring) for producing a probing force
  • sensor to evaluate contact information
  • interface to CMM for transmitting the information
  • there is a pretravel space from the contact to when the signal is triggered
  • the pretravel, in a three point sensor probe, depends on the direction of approach like a triangle
25
Q

piezo-electric probe: description

A
  • smaller deformations can be detected
  • pretravel is reduced
  • fast movements of the probe may cause unwanted signals, so only signals followed by a mechanical contact are considered
26
Q

types of measuring probes

A
  • serial kinematics
  • parallel kinematics
  • image probing
  • laser triangulation
  • structured light
  • focus variation principle
  • computed tomography
27
Q

serial kinematics contact measuring probe: description

A
  • one independent axis for each degree of freedom

- the position is obtained by simply adding values for each axis

28
Q

parallel kinematics contact measuring probe: description

A
  • more independent axis than dof
  • the position is a function of all the displacements of the axis
  • more complex
29
Q

why are the measures performed at low speed?

A

CMM can move quickly, but the measures must be performed at low speed, because high acceletaions give dynamic forces that impact on the performances of the system

30
Q

probing mode

A
  • for discrete point probing, the speed is constant, so that at the istant of contact the acceleration is zero, and there are no inertial forces
  • for scanning mode, it is not possible to obtain zero acceleration, because the speed vector should at least change direction, so variable inertial forces are present and may be relevant. the speed must be low.
31
Q

mechanical filtering effect of the tip ball: explanation

A

the diamater of the ball tip should be chosen considering the filtering effect it has on the measurement of a surface: small variation of the surface (roughness) are not detected by a big tip

32
Q

effective tip ball diameter: explanation

A

w0: elastic deformation of the workpiece and tip at contact, due to Hertzian stress distribution
w1: elastic deformation of the sylus stem

  • > the effective tip ball diameter is reduced due to the elastic deformation of the bodies
  • > this part can be considered a rigid body
33
Q

image probing: description

A
  • a CCD camera takes a picture of the object
  • a software extracts the element profile from the image
  • illumination is a key factor: episcopic light in the same side of the camera; daiscopic light in the opposite side
  • in general, 2D shapes can be measured, but the integation of auto-focus techniques can add the third dimension
34
Q

laser triangulation: description

A
  • a laser point or line is projected to the workpiece

- the point distance is evaluated by triangulation

35
Q

structured light: description

A
  • a series of lines of different dimension are projected on the surface
  • from the deformation of the lines it is possible to obtain a three dimensional representation of the surface
36
Q

fiber probe: description

A
  • it’s a touch trigger probe
  • the probing system is made of a optic fibre
  • a CCD camera detects the motion of the light when it touches the piece
37
Q

focus variation principle: description

A
  • a microscope takes images of the sample at different heights
  • at each height, only one section is focused, corresponding to the maximum of the function Fz
  • from the multiple images, a 3D image is obtained
38
Q

computer tomography: description

A
  • X-rays can penetrate objects, being more absorbed depending on the material and shape encoutered
  • a detector captures the x-rays escaping from the object (2D image)
  • combining the images from many views of the object, a 3D voxel can be extracted
  • from the voxel representation, the various features can be identified using suitable algorithms
  • it is possible to see also defects of the material
39
Q

multisensor systems

A
  • use of different optical and mechanical sensors on the same CMM
  • at the moment, only different separate measurements can be done
  • it is a reasarch topic the way to integrate data from different sensors
40
Q

types of software error compensation

A
  1. linear compensation: related to linear thermal expansion and linear scale error
  2. Computer Aided Accuracy
    - volumetric compensation
    - table bending
  3. probe system compensation
    - bending of the stylus
    - deviation of measuring systems
  4. Dynamic CAA
    - dynamic deviations of the overall machine contruction due to accelerations
41
Q

inspection planning: objectives

A 
starting from 
1. nominal part and the geometrical product specifications
2. coordinate measuring system available
3. knowledge of the machining process 
the inspection planning defines:
1. sampling strategies
2. fixture and probe configuration
3. probing path
42
Q

definition of the sampling strategy

A
  • choice of number and position of measurements
  • different strategies give different errors
  • a good strategy is better found having information about the process
  • related to the cost strategy is the inspection cost
  • the optimal strategy gives the lowest inspection cost
43
Q

evaluation of the inspection cost

A

two main factors:

  1. inspection errors:
    - false negative: cost of production of the part
    - false positive: difficul to be evalueted, it depends on the behaviour of the customer
  2. measurement cost:
    - strategy dependent (dicrete or continuous measurements)
    - strategy independent
44
Q

definition of the probe configuration

A
  • determine its orientation, structure, dimension
  • accessibility constraints need to be considered
  • it is important that the probe has the center of mass internal to its structure, to reduce bending
45
Q

definition of the fixture configuration

A
  • related to the probe configuration

- it defines the part orientation

46
Q

path planning

A
  • gieven the cloud of points to be measured, as defined in the sampling strategy, the best path should be found
  • TSP algorithms cannot be applied because there is no a priori knowledge of the arc length, and so it is a NP-hard problem
  • divide and conquer approach: visit problem separated from the computation of the length of the trajectories
  • a Manhattan distance approach can be used to find a possible path with an estimation of the distances; then the TSP algorithm can be applied

Computer Aided Manufacturing (15 decks)

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