Module 6 2 Flashcards

1
Q

What is the Punch Through Effect in MOS transistors?

A

Depletion region boundaries of source and drain meet to form a single depletion region.

This effect can lead to increased current flow and reduced control over the device.

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2
Q

Define Velocity Saturation in the context of MOS transistors.

A

Carrier velocity is linear and increases with electric field until saturation occurs, after which mobility decreases.

This phenomenon is critical in small geometry FETs.

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3
Q

What does DIBL stand for?

A

Drain-Induced Barrier Lowering.

This effect occurs when high velocity carriers near the drain gain extra energy, reducing the total current flow.

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4
Q

Describe the Hot Carrier Effect.

A

Carriers gain extra energy and can tunnel through gate oxide, altering current flow and reducing input impedance.

This effect can affect device reliability.

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5
Q

What impact does Mobility Degradation have on MOS transistors?

A

Reduction of drift velocity and mobility due to zig-zag paths caused by vertical electric fields from gate voltage.

This degradation significantly influences current-voltage characteristics.

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6
Q

Fill in the blank: The threshold voltage in MOS transistors can be influenced by the _______.

A

DIBL effect.

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7
Q

True or False: In small geometry FETs, the inversion is solely due to the fields of the gate.

A

False.

The inversion is influenced by both gate-to-source voltage and drain-to-source voltage.

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8
Q

What is the relationship between electric field strength and carrier velocity in MOS transistors?

A

Carrier velocity increases with electric field strength until it saturates.

Beyond saturation, the mobility of electrons decreases.

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9
Q

List the factors that cause Mobility Degradation.

A
  • Vertical electric field from gate voltage
  • Zig-zag path of carriers

These factors lead to a significant reduction in current flow.

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10
Q

What happens to the input impedance of a MOS transistor due to the DIBL effect?

A

It reduces the input impedance.

This alteration can affect the overall performance of the device.

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11
Q

What occurs to carriers in the presence of high velocity near the drain?

A

They gain extra energy, becoming hot carriers.

This energy gain can lead to tunneling through gate oxide.

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