Chapter 3

Question 1

Point defects

Answer 1

Vacancies
Intersticial atoms
Substitutional impurities

Question 2

Linear defects

Answer 2

Dislocations

Question 3

Interfacial defects

Answer 3

Grain boundaries

Question 4

Interstitial impurity

Answer 4

Favourable to maintain packaging factor less common than vacancy because of distortion

Question 5

Substitutions

Answer 5

Occur when the atomic radius is less than 15 percent host atom size

Question 6

Edge dislocation

Answer 6

Berger vector is perpendicular to dislocation line and produces extra half plane

Question 7

Screw dislocation

Answer 7

Burger vector is parallel to dislocation line

Question 8

Grain boundaries

Answer 8

More reactive, interstital impurities, high energy not fully bound

Question 9

Stacking fault

Answer 9

Error in planar stacking sequence

Question 10

Types of microscopes

Answer 10

Optical
Scanning electron
Transmition electron
Scanning probe microscopy

Question 11

Optical microscopy

Answer 11

2000x magnification

Grain boundaries are etched an appear as dark lines from scattered light

Question 12

Transmition electron microscope

Answer 12

1 million x mag

Scatters electrons further from microscope

Question 13

Scanning electron microscope

Answer 13

50,000x mag

Reflects electeons off of surface

Question 14

Scanning probe microscopy

Answer 14

10^9 mag

Generates 3D topo map of surface